X-ray Pinpoint Structural Measurement for Nanomaterials and Devices at BL40XU of the SPring-8

摘要

The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, “x-ray pinpoint structural measurement”, which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of “x-ray pinpoint structural measurement” technique are, 1) spatial resolution: ~ 100 nm, 2) time resolution: ~ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.