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Intense Photoluminescence and Photoluminescence Enhancement of Silicon Nanocrystals by Ultraviolet Irradiation

机译:紫外线照射硅纳米晶体的强烈光致发光和光致发光

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Photoluminescence (PL) from silicon nanocrystals deposited on top of silica-glass template and from silicon nanocrystals in nc_Si/SiO_2 multilayer films were studied as a function of ultraviolet (UV) laser irradiation time in vacuum. Both the films exhibit intense visible PL at room temperature under laser excitation. It was found that upon prolong irradiation time using a He-Cd laser (325 nm) the PL intensity of the films was spectacularly enhanced. The process is reversible and does not happen with excitation wavelength longer than 400 nm. Upon introducing air into the measurement chamber, a rapid decrease of the PL intensity was recorded. This observation suggests that the UV light may lead to modification of nonradiative recombination centers in the films and thus improves the emission yield of silicon nanocrystals.
机译:从沉积在二氧化硅 - 玻璃模板顶部的硅纳米晶体中的光致发光(PL)和NC_SI / SiO_2多层膜中的硅纳米晶体中的紫外(UV)激光照射时间在真空中的函数。在激光激发下,两种薄膜在室温下表现出强烈的可见PL。发现,在使用HE-CD激光(325nm)延长延长照射时间后,薄膜的PL强度具有壮观的增强。该过程是可逆的,并且不会发生激发波长长度超过400nm。在将空气引入测量室时,记录PL强度的快速降低。该观察结果表明,UV光可能导致薄膜中的非地形重组中心的改变,从而提高硅纳米晶体的排放产率。

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