Yield Improvements in Optoelectronic Production by Moving to a Clean Room

摘要

This paper describes the yield improvement in assembly, tuning and test when moving from a clean industrial environment into a clean room or clean zone of ISO class 8 with 3, 520, 000 particles/square meter (100,000 particles/square foot). The yield of clean connectors has gone from 87 % to 92 % at board level and from 71 % to 86 % at system level. In the industrial environment it was problem with dirty connectors in the test systems giving down times of around two hours a week. Into the clean room there has not been any down time at all during the six month the clean room has been in operation.