Bond's method used for a double-crystal spectrometer equipped with a poly-capillary half-lens

摘要

A new version of diffraction method for measuring the absolute values of intra-plane distances (spacing) d_(hkl) in crystals and epitaxial films using Kumakhov's X-ray poly-capillary half-lenses was developed. An attachment to general-purpose X-ray diffractometer MRD was developed to register difractograms within the angle range between 0/160 degrees with error of △d_(hk)/d ≌ 10~(-5). A method of precision d_(hkl) measurement was verified using perfect quartz crystals.