Topography Imaging of Material Surfaces using Atomic Force Microscope

摘要

The atomic force microscope (AFM) is a mechanical imaging instrument that measures the three dimensional topography at nanoscale as well as physical properties of a surface with a sharpened tip. This paper describes our AFM imaging process used for obtaining quality images in order to describe surface topography of different materials. Good topography information is a premise in nanoindentetion and in determining mechanical properties of materials. Samples used were: copper, nickel, titanium, polyamide and trabecular bone.