首页> 外文会议>North American Perpendicular Magnetic Recording Conference >Effect of grain size distribution on thermal decay in perpendicular recording with double layered media and single pole head by micromagnetic modeling
【24h】

Effect of grain size distribution on thermal decay in perpendicular recording with double layered media and single pole head by micromagnetic modeling

机译:微观型介质用双层介质和单杆头垂直记录热衰减晶粒尺寸分布的影响

获取原文

摘要

In this work, micromagnetic simulations of the read/write process for perpendicular systems have been performed. In higher recording densities, grain size distribution is more important due to the dependency of thermal decay and SNR on grain size distribution. Therefore magnetic layer was simulated by Voronoi cell with different standard deviation of grain sizes. The effect of soft under layer (SUL) on read/write was calculated by using cubic cell. For realistic writing head field, we used the single pole head field calculated by micromagnetics. Width and thickness of the write pole was 60 nm and 160 nm, respectively. Head sweep velocity during the writing process was taken to be 40m/s. SNR and thermal decay at linear density of 1058 kfci were calculated as a function of the different standard deviations of grain sizes. Thermal decay over long time scale was investigated by the Langevin equation [1] and the time-temperature scaling method. [2] SNR is calculated by reciprocity principle in a shielded magnetoresistive head.
机译:在这项工作中,已经执行了用于垂直系统的读/写过程的微磁性模拟。在更高的记录密度中,由于热衰减和SNR对晶粒尺寸分布的依赖性,粒度分布更为重要。因此,通过具有不同标准偏差的晶粒尺寸的Voronoi细胞模拟磁性层。通过使用立方细胞计算柔软层(SUL)在读/写上的效果。对于现实的书写头领域,我们使用了由微磁石计算的单极头字段。写杆的宽度和厚度分别为60nm和160nm。写入过程中的头部扫描速度被采用40米/秒。根据晶粒尺寸的不同标准偏差,计算SNR和线性密度以1058kFCI的线性密度的热衰减。 Langevin公式[1]和时间温度缩放方法研究了长时间尺度的热衰减。 [2] SNR通过屏蔽磁阻头中的互易原理来计算。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号