首页> 外文会议>ECS Meeting >Electronic Properties and Oxygen Nonstoichiometry of Mixed-conducting Oxide La{sub}(1-x)Sr{sub}xCoO{sub}(3-δ) Thin Films at High Temperature
【24h】

Electronic Properties and Oxygen Nonstoichiometry of Mixed-conducting Oxide La{sub}(1-x)Sr{sub}xCoO{sub}(3-δ) Thin Films at High Temperature

机译:在高温下的混合导电氧化物LA {SUS(1-X)SR {SUB} XCOO {SUB}(3-δ)薄膜的电子性质和氧气非沸石

获取原文

摘要

Thin films of the perovskite-type oxide La{sub}(1-x)Sr{sub}xCoO{sub}(3-δ) were deposited onto Ce{sub}0.9Gd{sub}0.1O{sub}1.95, SiO{sub}2 and single crystal MgO (100) substrates surface by a pulsed laser deposition (PLD) using a XeCl excimer laser to study the difference of the electronic properties and nonstoichiometry. It was shown that the oxygen nonstoichiometry of thin film is smaller than that of bulk for La{sub}(1-x)Sr{sub}xCoO{sub}(3-δ). The conductivity of the films were measured by a DC four probe method in 10{sup}(-4)-1 bar O{sub}2 gas at temperatures of 25-800°C. The activation energy of the conductivity for thin films strongly depends on substrates due to the mismatch of the thermal expansion coefficient between the thin film and the substrate. Although the temperature coefficient of conductivity of La{sub}(1-x)Sr{sub}xCoO{sub}(3-δ) bulk was negative for x≥0.4 and was positive for 0≤x≤0.3, that of thin film was positive irrespective of x. At the condition with the Co mean valence of 3.0 for x=0.4, 0.5, the conductivity shows large values for bulk, on the other hand, the conductivity is close to 0 for thin film. These facts suggest the electron hole in bulk is delocalized and metal like, while that in thin film is localized on cobalt ion.
机译:钙钛矿型氧化物的La {子}(1-X)的Sr {子} xCoO {子}(3-δ)沉积到铈{子} 0.9Gd {子} 0.1O {子} 1.95的SiO薄膜{子} 2和单结晶MgO(100)基片通过使用XeCl受激准分子激光器来研究电子性质和非化学计量的差的脉冲激光沉积(PLD)表面。结果表明,薄膜的氧非化学计量比体的La {子}(1-X)的Sr {子} xCoO {子}(3-δ)的小。的薄膜的电导率是由在10 {SUP}直流四探针法测定( - 4)-1在25-800℃的温度条-O {子} 2气体。电导率为薄膜的活化能强烈地依赖于底物,由于薄膜和衬底之间的热膨胀系数的失配。虽然拉{子}(1-X)的Sr {子} xCoO {子}的导电率的温度系数(3-δ)大部分是为x≥0.4阴性和阳性对0≤x≤0.3,该薄膜的是x的正无关。在具有3.0对于x = 0.4,0.5联合平均价数的条件下,导电性示出了用于散装大的值,另一方面,导电性是接近0为薄膜。这些事实表明在散装电子空穴被离域和金属等,而在薄膜上钴离子本地化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号