Analytical electron microscopy at high spatial resolution in a scanning-transmission mode has been used to investigate the effects of glassy or crystalline material additions on grain boundary chemistry in yttria-stabilized zirconia polycrystals. Powders of additive phase were mixed into 3-mol% yttria-stabilized tetragonal zirconia polycrystals ('3Y-TZP') or 8-mol% yttria-stabilized cubic zirconia polycrystals ('8Y-CSz'). Zirconias processed without additive phases were also examined. Without additives, grain boundaries were depleted in zirconium and enriched in yttrium. In 3Y-TZP with 1 wt% borosilicate glass, silicon was observed only at triple points, but not in grain boundaries. In 3Y-TZP with 1 wt% barium silicate glass, barium was observed both along grain boundaries and at triple points, whereas silicon was detected only within the triple points. This suggests either the composition of the additive phase at the grain boundary is different from that at the triple points, or that barium ions segregate to grain boundaries during processing. In 8Y-CSZ with 1 wt% silica, silicon was observed in grain boundaries by an EDS spatial differencing technique. In SY-CSZ with 10 wt% alumina, EDS revealed aluminum at all grain boundaries examined.
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