首页> 外文会议>PMSE Symposia >Novel High-K Polymer Composites with in- situ Formed Silver Nanoparticles for Embedded Capacitor Applications
【24h】

Novel High-K Polymer Composites with in- situ Formed Silver Nanoparticles for Embedded Capacitor Applications

机译:具有原位的新型高k聚合物复合材料,用于嵌入电容器应用的银纳米粒子

获取原文

摘要

Novel materials for embedded capacitor applications are in great and urgent demands, for which high dielectric constant (K), low dielectric loss and process compatibility with the PCBs are the most important prerequisites. Polymer composites provide an ideal solution to combine the dielectric or electrical properties of the ceramic or metal fillers, the low-temperature (<250癈) processability and mechanical properties of polymer matrix1-4. For conductor-insulator composite percolative systems with dramatic increase of K close to the percolation threshold, besides the well reported metal/polymer composites2-4, the carbon black (CB)/epoxy composite has also been considered as a candidate material for embedded capacitors due to its ultra-high K at lower filler loading and higher adhesion to the substrates compared to the polymer/ceramic composites5. Despite the extremely high K, the dissipation factor (Df) of carbon black composites is also very high, which implies the high dielectric loss of the system. So the high dielectric loss is one key issue of this system that needs to be addressed for the decoupling capacitor applications.
机译:对于嵌入式电容器应用的新材料是在大和迫切的要求,为此,高介电常数(K),低介电损耗和工艺兼容性与PCB是最重要的先决条件。聚合物复合材料提供了理想的解决陶瓷或金属填料,低温(<250癈)加工性和聚合物matrix1-4的机械性能的介电或电特性结合起来。用于带K接近渗透阈值,除了/聚合物composites2-4,炭黑(CB)/环氧树脂复合材料也被认为是一种候选材料由于嵌入式电容器阱报道金属的显着增加导体 - 绝缘体复合渗滤系统到其超高K值在较低的填料负载和更高的粘合性相比,聚合物/陶瓷composites5基材。尽管非常高K,碳黑复合材料的耗散因数(DF)也非常高,这意味着该系统的高介电损耗。因此,高介电损耗是该系统需要的去耦电容的应用加以解决的一个关键问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号