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Jahn-Teller levels of defects in A{sup}(IV)B{sub}(VI) semiconductors doped by high dose ion implantation

机译:由高剂量离子注入掺杂的{sup}(iv)b {sub}(vi)半导体中缺陷的Jahn-Teller水平

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Investigation of heavily doped semiconductors is a vast field, which remains actual in the physics of semiconductors. A{sup}(IV)B{sup}(VI) semiconductors are widely known and used in IR-detectors, long-wavelength lasers and thermoelectric converters. Owing to the high dielectric constant and the low value of effective mass of the carriers, the wave functions of shallow Coulomb centers must overlap and merge into allowed band even at relatively small impurity concentration. III-group impurities (In, Ga, Tl) lead to appearance of unique properties of these materials upon doping such as pining of the Fermi level persistent photoconductivity, negative magnetoresistance. These properties can be explained by the existence of localized and resonance states in these materials, which can lie in the forbidden, conduction and valence band depending on the compound composition and type of impurity. The model is connected with Jahn-Teller instability of the crystalline environment of point defects in A{sup}(IV)B{sup}(VI) semiconductors. We have tried to observe these states (levels) by producing high concentration of native defects For this goal ion implantation process with doses up to 10{sup}18 ions/cm{sup}2 was used. In addition to doping this process produces the vacancies (mainly tellurium vacancies) with the concentration of two orders of magnitude greater than the concentration of the implanted ions. It was shown (irrespective of type of ions) the existence of resonance level, which stabilizes the Fermi level in PbTe crystals at 80 K by 0.05 eV above the bottom of the conduction band.
机译:对重掺杂半导体的调查是一个巨大的领域,其在半导体物理中仍然存在。 A {sup}(iv)b {sup}(vi)半导体是广泛的已知的并且在IR检测器,长波长激光器和热电转换器中使用。由于高介电常数和载体的有效质量的低值,即使在相对较小的杂质浓度下,浅库仑中心的波函数也必须重叠并合并进入允许的带。 III-族杂质(Ga,T1)导致这些材料的独特性质,如掺杂,如Fermi水平持续光电导性,负磁阻。这些性质可以通过这些材料中的局部化和共振状态的存在来解释,这可以根据复合组合物和杂质类型位于禁止的,导通和价带中。该模型与{sup}(iv)b {sup}(vi)半导体中点缺陷的晶体环境的Jahn-Teller稳定性连接。我们尝试通过使用多达10℃/ cm {sup} 2的剂量来观察这些状态(水平)通过产生高达10℃的剂量的天然缺陷。除了兴奋剂外,该过程还产生浓度的空缺(主要是碲损失),其浓度大于植入离子的浓度。显示出(无论离子类型)是否存在共振水平,其稳定在80k的PBTE晶体中的FERMI水平在导通带底部的0.05eV中。

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