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Fatigue Crack Propagation Behavior in Functional Film-bonded Materials with Epoxy Bonding Layer (Noting Effects of Film Materials and Residual Stress)

机译:具有环氧粘结层的功能膜粘合材料中的疲劳裂纹繁殖行为(薄膜材料的注意力和残余应力)

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Pure copper and commercial grade iron film with the thickness of 100 #mu#m were bonded to steel base plate by using epoxy resin adhesive or by diffusion, which may be used for functional film-bonded materials in electronic parts. Residual stress caused on the epoxy bonded film was compress ion fur the iron film but tension for the copper film, respectively. This compressive residual stress on the iron film protected a fatigue fracture to the inner base plate from the surface film, thus the fatigue crack propagation life increased in the iron film more than in the copper film bonded plates with the tensile residual stress on the film. Using Young's modulus E and stress intensity factor #DELTA# K _(est)/E evaluated from the measured crack opening displacement, the fatigue crack propagation rate, da/dN, was expressed by a power low of #DELTA# K _(est)/E for all film bonded plates. The da/dN values in the epoxy bonded plates was high in the low #DELTA# K _(est)/E level less than the fatigue crack propagation threshold (#DELTA# K (est)/E))_(th) for the diffusion bonded plates.
机译:通过使用环氧树脂粘合剂或扩散,纯铜和商业级铁膜与厚度为100#mu#m的铁膜与钢基板键合,也可用于电子部件中的功能膜粘合材料。在环氧键合膜上引起的残余应力是压缩离子毛的铁膜,但分别用于铜膜的张力。在铁膜上的这种压缩残余应力从表面膜保护疲劳断裂到内基板,因此疲劳裂纹传播寿命比在铜膜粘合板中的铜膜中具有薄膜的拉伸残余应力。使用从测量的裂缝打开位移评估的杨氏模量和应力强度因子#δp_(est)/ e评估的裂缝开口位移,疲劳裂纹传播速率Da / dn由#delta#k _(EST)的功率低表示所有胶片粘合板的/ e。环氧键合板中的DA / DN值在低于疲劳裂纹传播阈值(#delta #k(Est)/ e))_(th)的低#delta#k _(est)/ e水平中高。扩散粘合板。

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