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Investigation on low frequency excitation for measuring DC-biased components by means of a singles sheet tester

机译：通过单打板测试仪测量DC偏置成分的低频激励的研究

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来源
《電気学会全国大会》|2000年||共1页
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作者
Masanori Nanba; Masanori Nakano; Koji Fujiwara; Norio Takahashi;
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中图分类 TM-53;
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机译：使用单片测试仪测量DC偏置磁化下的磁性
4. Investigation on low frequency excitation for measuring DC-biased components by means of a singles sheet tester [C] . Masanori Nanba, Masanori Nakano, Koji Fujiwara, 電気学会全国大会 . 2000

机译：通过单打板测试仪测量DC偏置成分的低频激励的研究
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7. Measuring Magnetic Properties under DC-biased Magnetization Using Single-Sheet Tester. [O] . M. Enokizono, Y. Takeshima, H. Matsuo 2000

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Investigation on low frequency excitation for measuring DC-biased components by means of a singles sheet tester

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