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Microstructures and critical currents in high-T_c superconductors

机译:高T_C超导体中的微观结构和临界电流

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摘要

Microstructural defects are the primary determining factors for the values of critical-current densities in a high T_c superconductor after the electronic anisotropy along the a-b plane and the c-direction. A eview is made to assess firstly what would be the maximum achievable critical-current density in YBa_2 Cu_3 O_u if nearly ideal pinning sites were introduced and secondly what types of pinning defects are currently introduced or exist in YBa_2Cu_3O_u and how effective are these in pinning vortices.
机译:微结构缺陷是在沿A-B平面和C方向的电子各向异性之后的高T_C超导体中的临界电流密度值的主要确定因子。如果引入了几乎理想的钉扎网站,则首先进行评估为评估yba_2 cu_3 o_u中的最大可实现的临界电流密度是什么,其次在YBA_2CU_3O_U中引入或存在于什么类型的钉纳缺陷以及这些钉子涡流有效有效。

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