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Ionization Energy and Electron Affinity of Clean and Oxidized Al{sub}xGa{sub}(1-x)N(0001) Surfaces

机译:冷却和氧化Al {Sub} {Sub}(1-x)曲面的电离能量和电子亲和力

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Ionization energies and electron affinities of clean Al{sub}xGa{sub}(1-x)N(0001) surfaces were investigated by ultraviolet photoemission spectroscopy over the whole composition range. The samples were cleaned with cycles of N{sup}+-ion sputtering and annealing partly within a Ga atom flux. The ionization energy is measured as 6.5 eV and is almost independent of the aluminum content in good agreement with the general chemical trend. The electron affinity decreases linearly with composition from 3.1 eV for GaN to 0.25 eV for AlN. No evidence for negative electron affinity at AlN(0001) surfaces was found. Adsorption of oxygen at room temperature leads to a significant increase of the ionization energy and electron affinity. With AlN(0001) surfaces, an oxygen uptake of 0.6 monolayers is observed after exposures of 10{sup}8 Langmuirs and the ionization energy increases by approximately 2 eV.
机译:通过紫外光荧光光谱在整个组成范围内研究了清洁Al {Sub} XGA {sub}(1-x)表面的电离能和电子亲和力。用N {SUP} + - 离子溅射的循环清洁样品,部分地在GA Atom通量内退火。电离能量被测量为6.5 eV,几乎与良好的铝含量与普通化学趋势吻合良好。电子亲和力与3.1eV用于GaN的组合物线性降低至0.25eV,适用于ALN。未发现在ALN(0001)表面上的负电子亲和力的证据。室温下氧气吸附导致电离能量和电子亲和力的显着增加。对于ALN(0001)表面,在10 {sup} 8朗马尔队的暴露后观察到0.6单层的氧吸收,并且电离能量增加约2eV。

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