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Nonvolatile memory effects in doped tetrahedral amorphous carbon thin films

机译:掺杂四面体无定形碳薄膜中的非易失性记忆效应

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Much interest has been shown in the use of tetrahedral amorphous carbon (ta-C) deposited by filtered cathodic arc as an inexpensive, easily produced, wide band-gap semicon-ductor in the fabrication of electronic devices. There has, however, been limited success in producing devices with properties that might make its use in electronic applications commercially viable, which in part may be due to the high density of electronic trap states as reflected in ta-C's rather high ESR signal of approx 10~(20) spin/g. Recent results at the University of Sydney suggest, however, that a new range of possibilities exist in the utilisation of these traps as a means of producing nonvolatile digital information storage. Devices with write times of 100 mu s, read times of 100 ns, and effective memory retention times approaching 1 year, have been fabricated.
机译:在使用过滤的阴极电弧沉积的四面体非晶碳(Ta-C)中,已经显示了许多感兴趣的是在电子设备的制造中沉积的过滤的阴极电弧作为廉价的宽带间隙半导体。然而,在生产具有可用于商业可行的电子应用中的性能的设备中的成功有限,这部分可能是由于在TA-C在TA-C相当高的ESR信号中反映的电子陷阱状态的高密度10〜(20)旋转/ g。然而,悉尼大学的最近结果表明,在利用这些陷阱时存在新的可能性,作为产生非易失性数字信息存储的手段。已经制造了带有100μm的写入时间的设备,100 ns的读数和接近1年的有效内存保留时间。

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