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Silicon avalanche photodiodes (APDs) for time-resolved x-ray measurements

机译:用于时间分辨X射线测量的硅雪崩光电二极管(APDS)

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We provide a general introduction to the use of silicon avalanche photo-diodes (APDs) for x-ray timing measurements. We describe (and compare) some devices available from various manufacturers. In general, time resolutions of approximately 1 ns are typical, and pulse widths from such devices are in the range of 1 to 10 ns, allowing high count rates to be reached, easily in excess of 10$+7$/ Hz. We include a table of different devices and detailed references.
机译:我们提供了对X射线定时测量的硅雪崩光电二极管(APDS)的使用概括。我们描述了(并比较)各种制造商可获得的一些设备。通常,大约1ns的时间分辨率是典型的,并且来自这种设备的脉冲宽度在1到10ns的范围内,允许达到高计数速率,容易超过10 $ + 7 $ / Hz。我们包括不同设备的表和详细的参考。

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