首页> 外文会议>International Microprocesses and Nanotechnology Conference >Nanoimprint Mold Repair by Ga{sub}+ Focused-Ion-Beam
【24h】

Nanoimprint Mold Repair by Ga{sub}+ Focused-Ion-Beam

机译:Ga {Sub} +聚焦 - 离子束的纳米视模修理

获取原文

摘要

Nanoimprint lithography (NIL) is very useful lithography technique. It has excellent features, such as being able to create lithographic printing that is sub-10 nm size over a large area. Usually a Si or SiO{sub}2/ Si mold is used as a NIL mold, which is delineated by using electron beam (EB) lithography and dry etching. In a conventional NIL process, poly(methylmethacrylate)(PMMA) is used as a replicated material. NIL process must heat PMMA above the glass transition temperature to deform the physical shape of the resist with a mold. As a glass transition temperature of PMMA is 105°C, PMMA was heated at around 120°C for 10-20 min in NIL process.
机译:Nanoimprint光刻(NIL)是非常有用的光刻技术。它具有优异的特征,例如能够在大面积上产生平版印刷。通常,Si或SiO {Sub} 2 / Si模具用作零模具,其通过使用电子束(EB)光刻和干蚀刻来描绘。在常规的NIL方法中,聚(甲基丙烯酸甲酯)(PMMA)用作复制的材料。 NIL工艺必须在玻璃化转变温度上方的热处理PMMA以使抗蚀剂的物理形状与模具变形。随着PMMA的玻璃化转变温度为105℃,在NIL工艺中,在约120℃下加热PMMA 10-20分钟。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号