首页> 外文会议>Conference on Hard X-Ray and Gamma-Ray Detector Physics,Optics,and Applications >Material parameter and performance variation in 4 x 4 pixellated CdZnTe detectors
【24h】

Material parameter and performance variation in 4 x 4 pixellated CdZnTe detectors

机译:4×4像素Cdznte检测器中的材料参数和性能变化

获取原文

摘要

Cadmium Zinc Telluride(CZT) gamma-ray detectors show great potential in medical and nuclear material imaging applications. These imagers rely on pixellated arrays of CZT for their operation. Systematic and random material variation among the pixels can introduce noise into the system and makes data analysis more complicated. Photo Induced Transient Current Spectroscopy(PICTS), and low temperature photoluminescence have been employed to analyze 4 x 4 pixellated arrays and to determine material variation among the pixels. Particular pixels that have proven to perform well or poorly have been studied in detail to try and identify the origin of this performance variation. This paper reports preliminary results and comments on future analysis.
机译:镉碲化镉(CZT)伽马射线探测器在医疗和核材料成像应用中表现出极大的潜力。这些成像仪依赖于CZT的像素化阵列进行操作。像素之间的系统和随机材料变化可以将噪声引入系统并使数据分析更加复杂。已经采用了光致瞬态电流光谱(图)和低温光致发光来分析4×4像素阵列并确定像素之间的材料变化。已经过详细地研究了已经证明的特定像素或者已经详细研究了尝试和识别这种性能变化的起源。本文报告了未来分析的初步结果和评论。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号