首页> 外文会议>Conference on Material Science and Material Properties for Infrared Optoelectronics >Recent progress in the study of characterization and properties of HgCdTe at the National Laboratory for Infrared Physics in China
【24h】

Recent progress in the study of characterization and properties of HgCdTe at the National Laboratory for Infrared Physics in China

机译:中国国家红外物理实验室催险特征研究及性能研究进展

获取原文

摘要

The characterization of impurities, defects, uniformity and some fundamental properties for the bulk and epitaxial HgCdTe(MCT) material undoped and doped with Sb, As, Fe have been investigated recently in our laboratory by means of photoluminescence, magneto-photoconductivity, quantum capacitance spectroscopy, transport measurements and other contactless nd nondestructive methods such as the IR, far-IR and millimeter wave measurements. This paper reports a portion of these new results.
机译:在我们的实验室中,通过光致发光,磁光电导性,量子电容光谱,在我们的实验室中已经研究了杂质和外延HGCDTE(MCT)材料的杂质和外延HGCDTE(MCT)材料的杂质和外延HGCDTE(MCT)材料的一些基本性质的表征,运输测量和其他非接触式ND非破坏性方法,如IR,FAR-IR和毫米波测量。本文报告了这些新结果的一部分。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号