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AUTOMATIC CALIBRATION OF HEIGHT SETTING MICROMETERS USING LASER INTERFEROMETER

机译:激光干涉仪的高度设定微米自动校准

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A laser interferometer-based system for automatic calibration of height setting micrometers is reported. The system consists of a vertical air slide, a two-frequency laser interferometer, a linear-motor driven horizontal slide and an electronic probe, all interfaced to a PC. A software written in C language has been developed to control the system and carry out the calibration. The performance of different types of probes is compared. Details of the system design, its own calibration, uncertainty budget and system performance are described. The new system has a measuring range of 350mm, resolution 40nm, expanded uncertainty of height measurement better than 0.5μm at 95% confidence level over full range. The whole calibration procedure can be completed within an hour. It is much more efficient and accurate than the conventional method - direct comparison with standard gauge blocks.
机译:报道了一种基于激光干涉仪的高度设定微米自动校准的系统。该系统由垂直的空气滑块,双频激光干涉仪,线性电动机驱动的水平载玻片和电子探头组成,全部接通到PC。已开发出用C语言编写的软件来控制系统并执行校准。比较了不同类型探针的性能。描述了系统设计的详细信息,其自身校准,不确定性预算和系统性能。新系统的测量范围为350mm,分辨率40nm,高度测量的不确定度,优于0.5μm,在全范围内以95%的置信水平。整个校准程序可以在一小时内完成。它比传统方法更有效和准确 - 与标准规格块直接比较。

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