Computer-aided reliability assessment of a digital MCM-C for GPS applications

摘要

Rapid and accurate reliability assessment is critical to the cost-effective development of electronic Systems. This paper describes CADMP-II, a software tool for reliability assessment which facilitates the incorporation of physics-of-failuremethods in the design and virtual qualification of many types of electronic products. The paper focuses on the use of CADMP-II to determine the temperature profile, the dominant failure mechanisms, and the expected lifetime for a 33 MHz digital MCM-Cmicrocontroller to be used in a global positioning system (GPS). The assessment indicates that this MCM-C can survive as designed for over 30 years in the intended environment.