Function testing and failure analysis of integrated circuit chip using laser probe

摘要

Introduced the construction of the experiment system of the laser probe measurements based on electro-optic sampling technique. Analyzed the relationship between the width of the optical pulses and the signal noise ratio of detection. The function of different stage circuit internal to the high-speed dynamic divider circuit chip have been measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure have been given.