We present a new high-precision and cost-efficient method of manufacturing aspheric crystals and pseudo-crystals. The concept including calculations, limits of precision, and manufacturing details is discussed. The advantages of this method are illustrated by the application and use of a Johansson bent quartz $LFAN@1340$RTAN crystal in an x-ray sequential spectrometer. The resolving power of the spectrometer is compared with the Siemens SRS 300 and the Fisons/ARL 8420 by a comparative measurement of uranium ore. The comparison involves the detection of 0.006% U (L$alpha@) with 0.11% Rb (K$alpha@) present as background. Options for future investigations and applications of this method are discussed.
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