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Measurement of temperature and strain distribution by Brillouin frequency shift in silica optical fibers

机译:硅胶光纤中布里渊频率频移的温度和应变分布的测量

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This paper describes the principles and recent development of a new technique for measuring temperature and strain distribution using Brillouin backscattering rather than Rayleigh and Raman backscattering. The technique is based on temperature- and strain-induced changes in the Brillouin frequency shift. Experimental sensitivities of 1.2 MHz/K and 5.8 MHz/10$+$MIN@4$/ strain are demonstrated at a wavelength of 1.32 $mu@m. Two approaches for measuring the weak Brillouin line are discussed.
机译:本文介绍了一种使用布里渊背光的温度和应变分布的新技术的原理和最新开发,而不是瑞利和拉曼反向散射。该技术基于布里渊频移的温度和应变引起的变化。实验敏感性为1.2MHz / k和5.8MHz / 10 $ + $ MIN @ 4 $ /应变在波长为1.32 $ MU @ M的波长上进行说明。讨论了测量弱布里渊线的两种方法。

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