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Novel truncated cone cavity for surface resistance measurements of high T/sub c/ superconducting thin films

机译:高T / SUP C /超导薄膜表面电阻测量的新型截短锥腔

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A truncated cone cavity that avoids degeneration between the TE/sub 01n/ and TM/sub 11n/ modes occurring in the most frequently used circular cylindrical cavities for materials measurements is described. Analytical expressions for the field components are given. An error analysis is carried out which yields a sensitivity of 2.3 m Omega for surface resistance measurements at 18 GHz, using samples with a diameter of 9 mm. One cavity was built, and measurement results are given for the surface resistance of various YBa/sub 2/Cu/sub 3/O/sub x/ thin films on MgO substrates. The samples were manufactured by means of laser ablation and magnetron sputtering.
机译:描述了截断的锥形腔,其避免在最常用的圆柱形腔中发生用于材料测量中的最常使用的圆柱形空腔之间的TE / SUM 01N /和TM / SUB 11N / MOD之间的变性。给出了现场组件的分析表达式。进行误差分析,其在18GHz下,使用直径为9mm的样品,在18GHz下对表面电阻测量产生2.3μmΩ的灵敏度。构建了一个腔,并给出了MgO基板上各种YBA / Sub 2 / Cu / Sub 3 / Su / sub X /薄膜的表面电阻的测量结果。通过激光消融和磁控溅射制造样品。

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