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Novel truncated cone cavity for surface resistance measurements of high T/sub c/ superconducting thin films

机译:新型截锥腔用于高T / sub c /超导薄膜的表面电阻测量

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A truncated cone cavity that avoids degeneration between the TE/sub 01n/ and TM/sub 11n/ modes occurring in the most frequently used circular cylindrical cavities for materials measurements is described. Analytical expressions for the field components are given. An error analysis is carried out which yields a sensitivity of 2.3 m Omega for surface resistance measurements at 18 GHz, using samples with a diameter of 9 mm. One cavity was built, and measurement results are given for the surface resistance of various YBa/sub 2/Cu/sub 3/O/sub x/ thin films on MgO substrates. The samples were manufactured by means of laser ablation and magnetron sputtering.
机译:描述了一种避免在最常用于材料测量的圆柱腔中发生的TE / sub 01n /和TM / sub 11n /模式之间变质的截锥腔。给出了场分量的解析表达式。进行了误差分析,使用直径为9 mm的样品进行18 GHz的表面电阻测量时,灵敏度为2.3 mΩ。建造一个腔,并给出在MgO衬底上的各种YBa / sub 2 / Cu / sub 3 / O / sub x /薄膜的表面电阻的测量结果。样品是通过激光烧蚀和磁控溅射制造的。

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