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Bend testing of micro-scale bulk metal specimens using a chip-scale test instrument

机译:使用芯片级测试仪器弯曲微级散装金属样品的测试

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We describe bend testing of micro- to meso-scale specimens of 302 stainless steel, using a MEMS test instrument. The specimens had gauge length of 350 microns, gauge width of 60 microns, and the thickness of 25 microns, and were made by lithographic etching of commercial stainless steel foil. We describe the use of a MEMS actuator to apply in-plane bending loads to the stainless steel specimens. The specimens' flexural stiffness obtained with this technique was in agreement with that obtained using a much larger table-top measurement system, but with an approximately 1000× reduction in size of the actuator.
机译:我们使用MEMS测试仪器描述了302不锈钢的微量至中间尺度标本的弯曲测试。标本具有350微米的表格长度,宽度为60微米,厚度为25微米,并通过商业不锈钢箔的光刻蚀刻制成。我们描述了MEMS执行器的使用将面内弯曲载荷施加到不锈钢样本。通过该技术获得的标本的抗弯刚度与使用更大的台式测量系统获得的抗弯曲刚度,但是致动器的尺寸约为1000倍。

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