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Correction of phase wrapping artifacts in grating-based hard X-ray tomography

机译:校正基于光栅硬X射线层析成像的相包装伪影

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X-ray grating interferometry (XGI) is a phase-contrast imaging technique that allows for a quantitative measurementof the refractive index with high density resolution in a model-independent manner|i.e. without a prioriknowledge of the specimen composition. However, the retrieval of the X-ray wavefront phase shift relies on theaccurate measurement of the interference pattern phase shift, making XGI vulnerable to phase wrapping whenthe interference pattern phase shift, related to the derivative of the wavefront phase shift, is large. Standardprocedure for avoiding phase wrapping involves submerging the specimen in a water bath to reduce the mismatchof the index of refraction at the boundaries, but this requires a top-down rotation stage and is susceptible togas bubble formation inside the water bath. Our team has presented an algorithm to remove phase wrappingartifacts for cylindrically shaped specimens that is applied to the phase-retrieved sinogram. This algorithmmodels and replaces phase-wrapped data to prevent the spread of cupping" artifacts due to the integration ofthe di erential phase during reconstruction. We give a criterion for selecting the modeling parameters so thatthe resulting measurement of the index of refraction matches the results of measurements without phase wrapping.We also apply this technique to cases where phase wrapping occurs at multiple interfaces. This algorithmallows for XGI measurements without a water bath and top-down rotation stage at synchrotron and laboratoryfacilities, especially as sensitivity increases.
机译:X射线光栅干涉测量法(XGI)是一种相对造影成像技术,其允许定量测量以型号独立的方式具有高密度分辨率的折射率I.。没有先验试样组成的知识。然而,X射线波前相移的检索依赖于精确测量干扰图案相移,使XGI易受相位包装与波前相移的导数相关的干扰图案相移是大的。标准避免相包装的程序涉及将样品浸入水浴中以减少不匹配边界的折射率的折射率,但这需要自上而下的旋转阶段并且易受水浴内部的气泡形成。我们的团队提出了一种删除阶段包装的算法用于柱面样本的艺术品,其应用于相位检索的Sinogram。这个算法模型并取代逐次包装数据,以防止由于集成而导致的拔罐“伪影的传播重建期间的不同阶段。我们提供了选择建模参数的标准,以便结果测量折射率与没有相位包装的测量结果相匹配。我们还将这种技术应用于在多个接口处发生相位包装的情况下。这个算法允许在同步浴和实验室的水浴和自上而下的旋转阶段的XGI测量设施,特别是敏感性增加。

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