首页> 外文会议>Conference on Optical Measurement Systems for Industrial Inspection >Tilted wave interferometer in common path configuration: challenges and realization
【24h】

Tilted wave interferometer in common path configuration: challenges and realization

机译:倾斜波干涉仪在公共路径配置中:挑战和实现

获取原文

摘要

Tilted Wave Interferometry has been invented and developed over the last 12 years as a exible and very fastmethod to test precision aspheres and freeform surfaces effciently. It measures surface deviations full field,with high lateral resolution, without any null compensator like CGH and without moving the tested part whilemeasuring. The test of non-spherical optical components is a topic of high relevance for optics industry, ascurrent optic designs rely heavily on those elements, since the small form factors and high performance of actualdesigns would be impossible with traditional spherical functional surfaces. As all precision components, aspheresand freeform surfaces need accurate inline quality control. Because of the high exibility and high measurementspeed of typically less than 30 sec., the TWI is well suited for close integration into the fabrication chain. Due tothe special illumination scheme, the first implementations of this new interferometer have been of Mach-Zehndertype. In this contribution we demonstrate, how the tilted wave interferometer principle can be implemented ina Fizeau configuration. The benefit of this configuration compared to the Mach-Zehnder configuration is thecommon path feature. Here, the reference beam and the measurement beam follow the same optical track insidethe interferometer, making the interferometer much more robust against temporal environmental inuences suchas vibrations and air turbulences. At the same time, the form tolerances of the interferometer components inthe common path area can be relaxed. These advantages of Fizeau configuration are well known. However,the multiple source illumination of the tilted wave interferometer leads to the generation of multiple referencewavefronts that can be disturbing. We therefore present a new TWI setup that avoids these problems. It relieson a new illumination design with four sets of illumination patterns that each generate their own referencewave. The new approach has been implemented in a lab setup and shows in first measurements the expectedimprovements in stability. We tested the system performance too in extensive Monte Carlo simulations. Thecommon path approach showed a reconstruction error of the test specimen of up to an order of magnitude lowercompared to the Mach-Zehnder configuration.
机译:倾斜波干涉测量学已经发明和开发了过去12年作为一个可见,非常快用于测试精密非球面和自由外形表面的方法。它测量表面偏差全景,具有高横向分辨率,没有任何空补偿器,如CGH,而无需移动测试部分测量。非球形光学元件的测试是光学行业高相关的主题,如目前的光学设计严重依赖于这些元素,因为较小的形状因素和高性能的实际传统的球形功能表面是不可能的。作为所有精密组件,非球面和自由态表面需要精确的内联质量控制。因为高灵活性和高测量通常小于30秒的速度,TWI非常适合于紧密集成到制造链中。由于特殊照明方案,这个新的干涉仪的第一实施方式一直是Mach-Zehnder类型。在这贡献中,我们证明,倾斜波干涉仪原理如何可以实现一个外接配置。与Mach-Zehnder配置相比这种配置的好处是公路功能。这里,参考光束和测量波束在内部遵循相同的光学轨道干涉仪,使干涉仪对颞环境更加强大这样作为振动和空气湍流。同时,干涉仪组件的形式公差可以放松公共路径区域。这些不同配置的这些优点是众所周知的。然而,倾斜波干涉仪的多源照明导致多个参考的产生波菲尔可以令人不安的。因此,我们提出了一个新的TWI设置,避免了这些问题。它依赖在具有四组照明模式的新照明设计上,每个照明模式都会产生自己的参考海浪。新方法已在实验室设置中实现,并在首次测量预期中显示稳定性的改善。我们在广泛的Monte Carlo模拟中测试了系统性能。这公共路径方法显示了测试标本的重建误差高达幅度下降与Mach-Zehnder配置相比。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号