首页> 外文会议>International Scientific Symposium on Electric Power Engineering >Coupled Tests Including Parameters TF and SLF of High Voltage SF6 Circuit Breakers
【24h】

Coupled Tests Including Parameters TF and SLF of High Voltage SF6 Circuit Breakers

机译:耦合测试包括高压SF6断路器的参数TF和SLF

获取原文

摘要

Standard short circuit tests of HV SF6 circuit breakers need high power sources and special synthetic facilities. Tests consist of many standard disciplines. Each of short fault disciplines requires high parameters from high power sources. They also require exact measurement and accurately control consequence of switching high current and high voltage circuit of synthetic method. Developing tests are therefore very expensive. The aim of this article is to introduce new point of view on testing by coupled terminal fault and short line fault while reducing high cost of developing tests.
机译:HV SF6断路器的标准短路测试需要高电源和特殊合成设施。测试包括许多标准学科。每个短故障学科都需要高功率源的高参数。它们还需要精确的测量和准确地控制合成方法的高电流和高压电路的后果。因此,开发测试非常昂贵。本文的目的是在耦合终端故障和短线故障引入新的测试点,同时降低了开发测试的高成本。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号