Development of surface sensitive DXAFS measurement method by applying Kramers-Kronig relations to total reflection spectra

摘要

Total reflection XAFS spectra are obtained combining with dispersive XAFS (DXAFS) configuration. A total reflection DXAFS spectrum of 30 nm Co layer on Si substrate was measured in 4 ms. Kramers-Kronig analysis was applied to extract XAFS signal from total reflection spectra. Spectra obtained by this method are comparable to usual XAFS spectra in terms of signal-to-noise ratios and peak positions in Fourier transformed EXAFS functions. The development of this Kramers-Kronig relations based DXAFS method is useful to study the variation of the surface state with the time resolution of millisecond.