Development of technique for three-dimensional visualization of grain boundaries by white X-ray microbeam

摘要

A technique for three-dimensional visualization of grain boundaries was developed at BL28B2 at SPring-8. The technique uses white X-ray microbeam diffraction and a rotating slit. Three-dimensional images of small silicon single crystals filled in a plastic tube were successfully obtained using this technique for demonstration purposes. The images were consistent with those obtained by X-ray computed tomography.