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Large-Volume Si(Li) Orthogonal-Strip Detectors for Compton Effect Based Instruments

机译:基于康普顿效应的康普乐效应的大批量Si(Li)正交 - 带探测器

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Recent developments of large-area Si(Li) orthogonal-strip detectors have revealed their capability for applications in Compton effect based instruments. Some inherent advantages of silicon like dominance of Compton scattering in photon interactions and operation at room or somewhat lower temperature combined with the availability of large-volume Si(Li) detectors could stimulate the development of powerful Compton instruments. Several 10 and 20 mm thick diodes with a diameter of 102 mm were fabricated. Two 10 mm thick diodes were cut to form a 74 mm × 74 mm square with slightly rounded corners. The same position-sensitive structure, 32 strips with a pitch of 2 mm, was produced on the thin Li-diffused n-contact and boron implanted p{sup}+-contact by means of photolithography and plasma etched grooves. The position-sensitive area of 64 mm × 64 mm is surrounded by a 5 mm wide guard-ring. One of these 10mm thick Si(Li) orthogonal-strip detectors will be mounted in a cryostat prepared at LLNL. There, the detector will be extensively tested with the goal to be integrated into the compact Compton camera system consisting of double-sided strip Si(Li) and HPGe detectors.
机译:大面积Si(Li)正交 - 带探测器的最新发展已经揭示了它们在基于康普顿效应的仪器中的应用的能力。硅的一些固有优势如康顿散射在光子相互作用和操作中的散射散射和稍微较低的温度与大容量Si(Li)探测器的可用性相结合的硅散射,可以刺激强大的康普顿仪器的发展。制造了直径为102毫米的几个10和20毫米的二极管。切割两个10毫米厚的二极管以形成74mm×74毫米正方形,略微圆角。通过光刻和等离子体蚀刻凹槽,在薄的Li-扩散的N接触和硼植物+ - 触点上产生相同的位置敏感结构,具有2mm的俯仰的32条带有2mm的条带。 64 mm×64 mm的位置敏感面积包围5毫米宽的防护环。这10毫米厚的Si(Li)正交 - 条探测器中的一种将安装在LLN1上制备的低温恒温器中。在那里,探测器将被广泛测试,目标是集成到紧凑型康普顿相机系统中,由双面剥离Si(Li)和HPGE探测器组成。

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