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Optimisation of X-ray micro-tomography for the in situ study of the development of plant roots

机译:X射线微断层扫描的优化植物根部发展的原位研究

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X-ray micro-tomography is a well-established technique for non-invasive, three-dimensional imaging of heterogeneous materials. A new application for high resolution low-dose tomography is the study of the development of plant roots. A cone-beam tomography system has been designed specifically to image the early development of plant seeds after germination, with a cubic voxel linear dimension of 100μm, over a sample diameter of 25 mm. The X-ray source is a 50 kVp silver target X-ray tube which is quasi-monochromatically filtered about the 22 keV characteristic K{sub}a silver peak. A 10 cm diameter X-ray image intensifier (XRII) is used to collect the two-dimensional projection images. The rotating sample table incorporates a linear translation mechanism to eliminate ring artefact that is commonly associated with 3rd generation tomography systems. Developing wheat seeds (Triticum aestivum) have been imaged using the system and the root lengths and volumes measured. The X-ray dose to the plants was also assessed and found to have no effect on the development of plant root.
机译:X射线微型层析术是一种用于非侵入性的非侵入性,三维成像的非侵扰材料的技术。高分辨率低剂量断层扫描的新应用是研究植物根部的发展。锥形束断层摄影系统专门设计用于在发芽后的植物种子早期发展,立方体体素线性尺寸为100μm,在样品直径为25mm。 X射线源是50 kVP银靶X射线管,其是关于22keV特性K {Sub}的准单色滤波。 10厘米直径的X射线图像增强器(XRII)用于收集二维投影图像。旋转样品表包括线性平移机构,以消除通常与第三发断层扫描系统相关的环形伪影。使用该系统和测量的根长度和根长度和体积进行成像开发小麦种子(Triticum aestivum)。还评估了植物的X射线剂量,发现对植物根部的发育没有影响。

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