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Automated Testing of CONCEPT's SCALE-2 ASIC Chipset using Konrad's Mixed-Signal Test System KT-7500 FINN

机译:使用KONRAD的混合信号测试系统KT-7500 FINN自动测试概念的秤-2 ASIC芯片组

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Untested ASICs and wafers generally have an estimated fail rate of several percent. A complete test of various functions within the ASIC according to full chipset specifications could eliminate the costs of resoldering failed ASICs after the product test and allow the final product function test to be simplified. To handle the 16 pin SOIC ASIC, a Multitest MT9928 was chosen to automate the test. The Konrad Mixed-Signal Tester KT-7500 FINN was an ideal tool to cover the various test steps. Using the Konrad Technologies mixed-signal tester produces high-quality statistical data of various ASIC functions. Simplification of the final product test leads to a significant cost improvement.
机译:未经测试的Asics和晶片通常具有估计的失败率为几个百分点。根据完整芯片组规格,ASIC内各种功能的完全测试可以消除产品测试后重新调用的成本并允许简化最终产品功能测试。为了处理16引脚SOIC ASIC,选择MULTIT MT9928以自动化测试。 KONRAD混合信号测试仪KT-7500 FINN是覆盖各种测试步骤的理想工具。使用KONRAD Technologies混合信号测试仪产生各种ASIC功能的高质量统计数据。简化最终产品测试导致显着的成本提高。

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