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Angle resolved photoemission spectroscopy study on electronic band structure of topological insulator Bi_2Se_3 in the presence of magnetic impurities

机译:角度分辨的光曝光光谱研究在磁杂质存在下拓扑绝缘子Bi_2se_3的电子带结构

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As magnetic ordering in topological insulators (Tis) can break the time reversal symmetry (TRS), the Tis are predicted to openup a band gap at the Dirac point in presence of magnetic impurities. To experimentally observe the effect of magnetic impurities on the electronic structure, we have performed high-resolution angle-resolved photoemission spectroscopy (ARPES) experiments on 3D Ti Bi_2Se_3 along with various magnetically doped compounds such as Co_(0.1)Bi_2Se_3, Mn_(0.1)Bi_2Se_3 and Eu_(0.1)Bi_(1.9)Se_3. Though no band gap opening at the Dirac point was observed due to very small amount of doping, a clear shift of Dirac point to higher binding energy was observed. Our measurements show the presence of conducting surface and insulatingbulk states for all the compounds and also indicate that all the magnetic elements we doped in Bi_2Se_3 provide additional electrons to the compound which eventually causes shift of the Dirac point.
机译:作为拓扑绝缘体(TIS)中的磁性排序可以打破时间反转对称性(TRS),预测TIS在存在磁杂质存在下在DIAC点处开隙。 为了通过实验观察磁杂质对电子结构的影响,我们在3D Ti Bi_2Se_3上进行了高分辨率角度分辨的光曝光光谱(ARPES)实验以及各种磁掺杂化合物,例如CO_(0.1)Bi_2se_3,MN_(0.1) Bi_2se_3和EU_(0.1)Bi_(1.9)SE_3。 虽然由于非常少量的掺杂而未观察到DIDAC点处的带间隙开口,但是观察到DIAC点对更高的结合能量的清晰移位。 我们的测量显示出对所有化合物的导电表面和绝缘坝状态的存在,并且还表明我们在Bi_2Se_3中掺杂的所有磁性元件向所述化合物提供额外的电子,最终导致DIRAC点的移位。

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