首页> 外文会议>DAE Solid State Physics Symposium >Electronic Properties of Hexagonal Gallium Phosphide: A DFT Investigation
【24h】

Electronic Properties of Hexagonal Gallium Phosphide: A DFT Investigation

机译:六角磷化镓的电子性质:DFT调查

获取原文

摘要

A detail density functional investigation is performed to develop hexagonal 2D gallium phosphide material. The geometry, band structure and density of states (total and projected) of 2D hexagonal GaP are reported in detail. It is heartening to note that the developed material is identified as an indirect band gap semiconductor. The indirect gap for this material is predicted as 1.97 eV at K-Γ, and a direct gap of 2.28 eV at K point is achieved, which is very close to the reported direct band gap for zinc blende and buckled structures of GaP.
机译:进行详细密度函数调查以开发六边形2D磷化镓材料。详细介绍了2D六边形间隙状态(总和投影)的几何,带状结构和密度。令人振奋的是,所发达的材料被识别为间接带隙半导体。该材料的间接间隙预测为K-γ的1.97eV,实现了k点的直接间隙,这是非常接近锌混合的锌混合和间隙结构的报告的直接带隙。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号