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The factors that affect the defect sizing capabilities of the Magnetic Flux Leakage Technique

机译:影响磁通量泄漏技术缺陷尺寸的因素

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This paper is concerned with identifying the inherent Magnetic Flux Leakage (MFL) technology variables that affect the sizing of defects and the repeatability of results. External defect sizing factors such as operator competence and inspection environment are here assumed pacified and so not considered. With these extraneous variables removed saturation, calibration and defect geometry can be investigated, both globally and in the context of the technology employed herein. Under-saturation is revealed to be a major limiting factor in defect sizing. Consequently to overcome the limitations presented by under-saturation a new calibration procedure is proposed. Further suppositions pertaining to defect sizing are then verified empirically and in some cases confirmed via numerical simulation. The paper naturally concludes with a discussion of the results and where possible improvements could be made.
机译:本文涉及识别影响缺陷尺寸和结果的可重复性的固有磁通量泄漏(MFL)技术变量。这里假设诸如操作员能力和检验环境之类的外部缺陷大小因素,因此不考虑。利用这些外来变量去除饱和,可以在全球和在本文所用技术的上下文中研究校准和缺陷几何。饱和度被揭示为缺陷尺寸的主要限制因素。因此,为了克服饱和度呈下呈现的限制,提出了新的校准程序。然后经验经验验证与缺陷尺寸有关的进一步假设,并且在某些情况下通过数值模拟确认。本文自然会结束,讨论结果,可以进行可能的改进。

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