首页> 外文会议>SPIE Conference on Infrared Technology and Applications >Analysis of background irradiation in thermal IR hyper-spectralimaging systems
【24h】

Analysis of background irradiation in thermal IR hyper-spectralimaging systems

机译:热IR超光谱分析系统中背景辐射分析

获取原文
获取外文期刊封面目录资料

摘要

Our group designed a thermal IR hyper-spectral imaging system in this paper mounted in a vacuum encapsulated cavity with temperature controlling equipments. The spectral resolution is 80 nm; the spatial resolution is 1.0 mrad; the spectral channels are 32. By comparing and verifying the theoretical simulated calculation and experimental results for this system, we obtained the precise relationship between the temperature and background irradiation of optical and mechanical structures, and found the most significant components in the optic path for improving imaging quality that should be traded especially, also we had a conclusion that it should cool the imaging optics and structures to about 100K if we need utilize the full dynamic range and capture high quality of imagery.
机译:我们的小组在本文中设计了一种热量的IR超光谱成像系统,该系统安装在具有温度控制设备的真空封装腔内。光谱分辨率为80nm;空间分辨率为1.0 mrad;光谱通道为32.通过比较和验证该系统的理论模拟计算和实验结果,我们获得了光学和机械结构的温度和背景照射之间的精确关系,并发现了用于改善的光学路径中最重要的组件应尤其是应交易的成像质量,如果我们需要使用全动态范围并捕获高质量的图像,我们应该将成像光学和结构冷却到大约100k。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号