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Analysis and quantification of laser-dazzling effects on IR focal planearrays

机译:IR焦点外包率激光尖锐效果的分析与定量

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Today Optronic Countermeasure (OCM) concerns imply an IR Focal-Plane Array (FPA) facing an in-band laser irradiation. In order to evaluate the efficiency of new countermeasure concepts or the robustness of FPAs, it is necessary to quantify the whole interaction effects. Even though some studies in the open literature show the vulnerability of imaging systems to laser dazzling, the diversity of analysis criteria employed does not allow the results of these studies to be correlated.Therefore, we focus our effort on the definition of common sensor figures of merit adapted to laser OCM studies. In this paper, two investigation levels are presented: the first one for analyzing the local nonlinear photocell response and the second one for quantifying the whole dazzling impact on image. The first study gives interesting results on InSb photocell behaviors when irradiated by a picosecond MWIR laser. With an increasing irradiance, four different successive responses appear: from linear, logarithmic, decreasing ones to permanent linear offset response. In the second study, our quantifying tools are described and their successful implementation through the picosecond laser-dazzling characterization of an InSb FPA is assessed.
机译:如今,Optronic对策(OCM)涉及面向带内激光照射的IR焦平面阵列(FPA)。为了评估新的对策概念的效率或FPA的鲁棒性,有必要量化整个互动效应。尽管在公开文献中的一些研究表明,成像系统对激光炫目的脆弱性,所采用的分析标准的多样性并不允许这些研究的结果相关。因此,我们将努力集中在普通传感器数据的定义上适应激光OCM研究的优点。在本文中,提出了两种调查水平:第一个用于分析局部非线性光电池响应的第一级,以及用于量化对图像的整个令人眼花缭乱的影响。第一项研究在由PicoSecond MWIR激光器照射时,在Insb Photocell行为上给出了有趣的结果。随着辐照度的增加,出现四种不同的连续响应:从线性,对数,减少到永久性线性偏移响应。在第二次研究中,描述了我们的量化工具,并评估了通过PicoSecond激光炫目的成功实现进行了评估了INSB FPA的表征。

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