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Criteria Selection for 20×20×15 mm~3 Pixelated CdZnTe Semiconductor Detectors

机译:20×20×15mm〜3像素化Cdznte半导体检测器的标准选择

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Large volume, pixelated Cadmium Zinc Telluride detectors have been developed over the past decade. In November of 2009, Redlen Technologies began manufacturing 130 20×20×15 mm~3 CdZnTe detectors, each with a common grid between the 121 pixels, for the Polaris Project. Results for the first 65 detectors were studied to determine a set of criteria that could be used to help streamline the detector testing procedure for large volume CdZnTe detectors. By rejecting detectors with >5% uncorrected FWHM, >2 nA/V of total grid-to-anode leakage current, and excessive anode noise detectors with over 1.2% corrected single pixel FWHM at 662 keV were correctly identified 88% of the time. Those with under 1.2% corrected single pixel FWHM at 662 keV were correctly identified 80% of the time.
机译:大量的像素化镉锌碲化镉探测器已经在过去十年中开发出来。 2009年11月,Redlen Technologies开始制造130 20×20×15mm〜3个Cdznte探测器,每个探测器都有121像素之间的通用网格,用于Polaris项目。研究了前65个探测器的结果,以确定一组可用于帮助简化大容量Cdznte检测器的检测器测试程序的一组标准。通过拒绝具有> 5%未校正的FWHM的探测器,> 2 NA / V的总电网与阳极漏电流,并且过量阳极噪声探测器,具有超过1.2%校正的单像素FWHM,在662keV时被正确地确定了88%的时间。在662keV为662keV的1.2%校正的单像素FWHM的那些被正确识别了80%的时间。

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