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Criteria selection for 20×20×15 mm3 pixelated CdZnTe semiconductor detectors

机译:20×20×15 mm 3 像素化CdZnTe半导体探测器的标准选择

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Large volume, pixelated Cadmium Zinc Telluride detectors have been developed over the past decade. In November of 2009, Redlen Technologies began manufacturing 130 20×20×15 mm3 CdZnTe detectors, each with a common grid between the 121 pixels, for the Polaris Project. Results for the first 65 detectors were studied to determine a set of criteria that could be used to help streamline the detector testing procedure for large volume CdZnTe detectors. By rejecting detectors with >5% uncorrected FWHM, >2 nA/V of total grid-to-anode leakage current, and excessive anode noise detectors with over 1.2% corrected single pixel FWHM at 662 keV were correctly identified 88% of the time. Those with under 1.2% corrected single pixel FWHM at 662 keV were correctly identified 80% of the time.
机译:在过去的十年中,已经开发出大容量的像素化碲化镉锌锌探测器。 2009年11月,Redlen Technologies开始为Polaris项目制造130个20×20×15 mm 3 CdZnTe检测器,每个检测器在121个像素之间具有一个公共网格。对前65个检测器的结果进行了研究,以确定一组标准,这些标准可用于帮助简化大体积CdZnTe检测器的检测器测试程序。通过剔除> 5%未校正FWHM的检测器,> 2 nA / V的总的栅极到阳极泄漏电流,以及在662 keV处校正了超过1.2%的单像素FWHM的过多阳极噪声检测器,可以在88%的时间内正确识别出。那些在662 keV处校正后的单像素FWHM低于1.2%的像素在80%的时间内被正确识别。

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