Pausible clocking based globally-asynchronous locally-synchronous (GALS) system design has been proven a promising approach to SoCs and NoCs. In this paper, we analyze the throughput reduction and synchronization failures introduced by the widely used pausible clocking scheme, and propose an optimized scheme for higher throughput and more reliable GALS design. The local clock generator is improved to minimize the acknowledge latency, and a novel input port is applied to maximize the safe timing region for the clock tree insertion. Simulation results using the IHP 0.13-μm standard CMOS process demonstrate that up to one-third increase in data throughput and an almost doubled safe timing region for clock tree distribution can be achieved in comparison to the traditional pausible clocking scheme.
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