MEASUREMENT OF THE REFRACTIVE INDEX PROFILE OF POLYMER PLANAR OPTICAL WAVEGUIDES USING OPTICAL COHERENCE TOMOGRAPHY

摘要

Polymer planar optical waveguides fabricated onto electrical printed circuit boards are receiving great interest as a technology to produce optical printed circuit boards for use as computer backplanes. The measurement of the refractive index profile of the polymer planar optical waveguides is required to better understand and model the transmission properties of these waveguides. In this paper optical coherence tomography is used to measure the refractive index profile of a (～1mm) cross section slice of the polymer planar optical waveguide.