Determining of Magnetic Resonance Forces on a MEMS Cantilever in a Fusarium Graminearum Spore Detector

摘要

Magnetic Resonance Force Microscopy is used in a sensor to detect Fusarium Graminearum fungus. The sensor uses an array of MEMS cantilevers to detect the chemical composition of a sample. The sample is adhered by an antifungal antibody to the surface below the cantilever. Computer simulations are used to determine the force which acts on the cantilever given an RF pulse of a given frequency. The results from this work are used in the design of a cantilever of the target sensor and can be expanded on for detection of other spore types.