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Photonic Guided-Path Tomography Sensor for Deformation in a Non-planar Surface

机译:光子导向路径断层扫描传感器,用于非平面表面变形

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We introduce theoretically and demonstrate experimentally the performance of a Guided-Path Tomography sensor head and a complete system for imaging of physical parameters on non-planar and possibly flexible surfaces. Novel in our approach is to employ waveguiding sensor elements, strategically arranged on the imaged surface, to allow tomography measurements and the inverse problem solution. In the reported particular implementation we image deformation over approx1sq.m., which is achieved by sensitizing the sensor elements to bending. The problem of severely limited number of measurements is addressed by an original method for sinogram recovery, followed by the application of well established methods for solving the hard-field tomography inverse problem. We show that the sensor is capable of distinguishing objects of different mass and shape of footprint. It also calculates the coordinates of the centre of mass of the imaged objects, which facilitates integration with control systems.
机译:我们理论上介绍并实际展示了导向路径断层扫描传感器头的性能和一个完整的系统,用于在非平面和可能的柔性表面上成像物理参数。我们的方法中的小说是采用波导传感器元件,策略性地布置在成像表面上,以允许断层摄影测量和逆问题解决方案。在报告的特定实施方案中,我们通过敏感传感器元件敏感到弯曲来实现的近似的图像变形。通过原始方法进行了严重限制数量的测量的问题,用于宿舍的原始方法,然后应用于解决硬场断层扫描逆问题的良好建立方法。我们表明传感器能够区分不同质量和占地面积形状的物体。它还计算成像物体质量中心的坐标,这有助于与控制系统集成。

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