首页> 外文会议>International Solid-State Sensors, Actuators and Microsystems Conference >MEASUREMENT OF SHEAR STRESS BETWEEN SINGLE-WALL CARBON NANOTUBES AND SUBSTRATES USING NEMS DEVICES
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MEASUREMENT OF SHEAR STRESS BETWEEN SINGLE-WALL CARBON NANOTUBES AND SUBSTRATES USING NEMS DEVICES

机译:使用NEMS器件测量单壁碳纳米管和基板之间的剪切应力

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This paper presents a novel and easily controllable method for measurement of the interaction of single-wall carbon nanotubes (SWNTs) with surfaces using simple cantilever beams, a nanomanipulator, and a scanning electron microscope (SEM). A small SWNT bundle is assembled across two cantilevers by dielectrophoresis, with one cantilever much more flexible than the other. The flexible cantilever is then pushed away from the stiffer cantilever in order to produce slip between the SWNTs and the cantilever surface. When the cantilever returns to its initial position, axial slack is observed in the SWNTs. A theoretical model has been developed to calculate the shear stress between the SWNT bundle and the cantilever surface, based on the measured axial slack. For a gold cantilever surface, an average interfacial shear stress of 113 MPa was obtained.
机译:本文介绍了一种新颖且易于控制的方法,用于测量单壁碳纳米管(SWNT)与使用简单的悬臂梁,纳米操纵器和扫描电子显微镜(SEM)的表面的单壁碳纳米管(SWNT)的相互作用。通过介电泳,一个小的SWNT束在两个悬臂上组装,一个悬臂比另一个更灵活。然后将柔性悬臂从更硬的悬臂推开,以在SWNT和悬臂表面之间产生滑动。当悬臂返回其初始位置时,在SWNT中观察到轴向松弛。已经开发了理论模型来计算SWNT束和悬臂表面之间的剪切应力,基于测量的轴向松弛。对于金悬臂表面,获得113MPa的平均界面剪切应力。

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