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CALIBRATION OF CAPACITIVE SENSORS AND ELECTRONIC LEVELS FOR THE STRAIGHTNESS MEASUREMENTS USING MULTIPROBE METHOD

机译:使用多级方法校准电容传感器和电子电平的直线测量

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In this work, the straightness length 300 mm measurement under nanometer uncertainty. The proposed methodology represents a process known as propagation using the assumption of small displacement which leads to solving an overdetermined linear system. The experimental studies were carried out on the capacitive sensors and electronic levels. The least squares mathematic method is apply to calculate the optimal solution. This method requires taking into account the uncertainties of the two different types of sensors leads to method of weighted least squares. The first step is to calibrate the sensors and to estimate the effect on the calculated straightness.
机译:在这项工作中,在纳米不确定性下测量的直线度长300mm。所提出的方法代表了使用小位移的假设称为传播的过程,这导致求解过过定的线性系统。实验研究在电容传感器和电子水平上进行。适用最小二乘数学方法以计算最佳解决方案。该方法需要考虑两种不同类型的传感器的不确定性导致加权最小二乘法的方法。第一步是校准传感器并估计对计算的直的效果。

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