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Photonic band measurement by angle-resolved spectroscopy and polarimetry

机译:通过角度分辨光谱和偏振谱测量光子带测量

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In this work we show the application of the angle-resolved spectroscopic reflectivity and polarimetry to the characterization of 2D photonic crystal structures in the form of slabs. The method we introduce is based on the combination of i) the numerical simulation of the interaction of the incident light with the photonic crystal, ii) the experimental measurement and iii) the comparison of both results. We show that the calculations predict the coupling of the incident light to photonic modes propagating inside the structure, related to the photonic bands of the infinite photonic crystal. We demonstrate this coupling in the experimental measurements for two kinds of samples consisting of 2D photonic crystal slabs of micro- and nanostructured photoresist on a silicon substrate.
机译:在这项工作中,我们展示了角度分辨光谱反射率和偏振谱的应用以板坯形式的2D光子晶体结构的表征。我们介绍的方法是基于I)的组合),入射光与光子晶体的相互作用的数值模拟,ii)实验测量和III)两种结果的比较。我们表明计算预测入射光与在结构内传播的光子模式的耦合,与无限光子晶体的光子带相关。我们在实验测量中展示了该偶联的两种样品,其两种样品由硅衬底上的微型和纳米结构光致抗蚀剂的2D光子晶体板组成。

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