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Measurement method and apparatus of the photonic band structure of the photonic crystal waveguide

机译:光子晶体波导的光子带结构的测量方法和装置

摘要

PROBLEM TO BE SOLVED: To exactly and simply measure a photonic band structure of a photonic crystal waveguide in a radiation mode and in a waveguide mode from the exterior while eliminating restriction on the crystal waveguide which is a measuring object.;SOLUTION: In this measurement method for the photonic band structure of the photonic crystal waveguide, a prism is disposed on a photonic crystal layer of the crystal waveguide so that the bottom part of the prism stands opposite thereto with a prescribed gap left by the crystal layer. In letting an incident beam through the prism into the crystal layer of the crystal waveguide, the incident beam is let into the bottom part of the prism at an incident angle equal to or more than a total reflection angle after entering the prism. The incident beam is totally reflected by the bottom part of the prism and let out from the prism as an outgoing beam, based on which the band structure is measured.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:从外部精确地并且简单地在辐射模式和波导模式下测量光子晶体波导的光子能带结构,同时消除对作为测量对象的晶体波导的限制。对于光子晶体波导的光子带结构的方法,在晶体波导的光子晶体层上设置棱镜,以使棱镜的底部与晶体层相对地隔开预定的间隙。在使入射光束通过棱镜进入晶体波导的晶体层时,入射光束在进入棱镜之后以等于或大于全反射角的入射角进入棱镜的底部。入射光束被棱镜的底部完全反射,并作为出射光束从棱镜中射出,以此为基础测量带结构。版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP4657775B2

    专利类型

  • 公开/公告日2011-03-23

    原文格式PDF

  • 申请/专利权人 独立行政法人理化学研究所;

    申请/专利号JP20050091076

  • 发明设计人 青柳 克信;井上 振一郎;

    申请日2005-03-28

  • 分类号G01M11/00;G01N21/27;G02B6/12;

  • 国家 JP

  • 入库时间 2022-08-21 18:18:19

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